Colloquium Dr. Arie den Boef (ASML & ARCNL)

05 - 02 - 2016 om 11:00 tot 05 - 02 - 2016 om 12:00


Friday 5 February, 11:00h, at Nikhef in H331.

Speaker: Dr. Arie den Boef (ASML & ARCNL).

Title: “Optical Metrology of Semiconductor Wafers in Lithography“.

Abstract: